TEST_NAME : Wafer
TEST_DATE : 24_09_02-09_43_01
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-017-018-05 | FUSED_ID : 6359364768390779173
  IC_TEMP :  -53.76 | VDDM : 1135.40 | AUX_INT : -133.05 | CsaBias :  -17.87
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.38598e-03 / 2
  ADC_P0  : -1.33050e-01 ± 3.20408e-02
  ADC_P1  : 9.72749e-03 ± 7.19763e-04
  ADC_P2  : -1.07553e-05 ± 3.18331e-06
  CSA_Chi2/NDF : 1.36194e-04 / 2
  CSA_P0  : 5.91905e-02 ± 7.78396e-03
  CSA_P1  : 9.86860e-03 ± 5.86466e-04
  CSA_P2  : -4.48511e-05 ± 8.93118e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [25, 30, 31, 97, 110, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [23, 53, 87, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4546', '1.800', '0.1343', '1.800', '0.0933', '7.000', '0.7078', 1, 1, 1, 1, 1725262981.3870847]
VI_after__Init : ['1.201', '0.4545', '1.800', '0.1343', '1.801', '0.0878', '7.000', '0.7078', 1, 1, 1, 1, 1725262989.4464743]
VI_at__the_End : ['1.201', '0.4988', '1.800', '0.1367', '1.799', '0.1125', '7.000', '0.7084', 1, 1, 1, 1, 1725263056.2650712]