TEST_NAME : Wafer
TEST_DATE : 24_09_02-09_41_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-017-019-05 | FUSED_ID : 6359364768390779189
  IC_TEMP :  -47.53 | VDDM : 1124.98 | AUX_INT :   -8.70 | CsaBias :   93.67
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.32400e-03 / 2
  ADC_P0  : -8.70053e-03 ± 2.46978e-02
  ADC_P1  : 7.93338e-03 ± 5.83504e-04
  ADC_P2  : -4.53807e-06 ± 2.74815e-06
  CSA_Chi2/NDF : 1.05305e-04 / 2
  CSA_P0  : 5.74818e-02 ± 6.84457e-03
  CSA_P1  : 9.67198e-03 ± 5.15689e-04
  CSA_P2  : -3.96603e-05 ± 7.85333e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [26, 46, 53, 57, 70, 88, 103, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [29, 32, 75, 85, 122, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2471', '1.800', '0.1232', '1.800', '0.0915', '7.000', '0.7076', 1, 1, 1, 1, 1725262885.0038252]
VI_after__Init : ['1.202', '0.2471', '1.800', '0.1231', '1.800', '0.0856', '7.000', '0.7075', 1, 1, 1, 1, 1725262893.7701025]
VI_at__the_End : ['1.201', '0.5058', '1.800', '0.1361', '1.800', '0.1098', '7.000', '0.7085', 1, 1, 1, 1, 1725262960.526643]