TEST_NAME : Wafer
TEST_DATE : 24_09_02-10_06_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-018-012-12 | FUSED_ID : 6359364768390783180
  IC_TEMP :  -47.58 | VDDM : 1128.95 | AUX_INT :   -6.93 | CsaBias :   65.60
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.07840e-03 / 2
  ADC_P0  : -6.93119e-03 ± 2.22995e-02
  ADC_P1  : 8.09906e-03 ± 5.47867e-04
  ADC_P2  : -4.41165e-06 ± 2.66985e-06
  CSA_Chi2/NDF : 1.15608e-04 / 2
  CSA_P0  : 6.16817e-02 ± 7.17161e-03
  CSA_P1  : 9.82969e-03 ± 5.40329e-04
  CSA_P2  : -4.31258e-05 ± 8.22858e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [13, 18, 44]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [4, 14, 41, 55, 64, 70, 117, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3456', '1.800', '0.1282', '1.799', '0.0895', '7.000', '0.7071', 1, 1, 1, 1, 1725264417.6907427]
VI_after__Init : ['1.202', '0.3457', '1.800', '0.1282', '1.800', '0.0838', '7.000', '0.7071', 1, 1, 1, 1, 1725264425.710143]
VI_at__the_End : ['1.198', '0.5030', '1.800', '0.1394', '1.800', '0.1111', '7.000', '0.7079', 1, 1, 1, 1, 1725264484.9675834]