TEST_NAME : Wafer
TEST_DATE : 24_09_02-10_08_34
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-018-013-12 | FUSED_ID : 6359364768390783196
  IC_TEMP :  -51.17 | VDDM : 1110.78 | AUX_INT :   -8.54 | CsaBias :   81.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.34779e-03 / 2
  ADC_P0  : -8.53564e-03 ± 2.49373e-02
  ADC_P1  : 8.21077e-03 ± 6.13491e-04
  ADC_P2  : -4.68829e-06 ± 3.00674e-06
  CSA_Chi2/NDF : 1.57190e-04 / 2
  CSA_P0  : 6.01056e-02 ± 8.36249e-03
  CSA_P1  : 1.01404e-02 ± 6.30053e-04
  CSA_P2  : -4.75773e-05 ± 9.59496e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [4, 23, 46, 52, 56]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [3, 4, 40, 49, 76, 101, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1314', '1.800', '0.1387', '1.800', '0.0790', '7.000', '0.7070', 1, 1, 1, 1, 1725264513.425374]
VI_after__Init : ['1.202', '0.1314', '1.800', '0.1387', '1.800', '0.0733', '7.000', '0.7068', 1, 1, 1, 1, 1725264522.2137263]
VI_at__the_End : ['1.202', '0.5064', '1.800', '0.1384', '1.802', '0.1105', '7.000', '0.7076', 1, 1, 1, 1, 1725264583.8679366]