TEST_NAME : Wafer
TEST_DATE : 24_09_02-10_16_35
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-018-018-11 | FUSED_ID : 6359364768390783275
  IC_TEMP :  -55.89 | VDDM : 1127.70 | AUX_INT :   -6.67 | CsaBias :   89.53
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.90550e-04 / 2
  ADC_P0  : -6.66806e-03 ± 2.02346e-02
  ADC_P1  : 8.07167e-03 ± 4.92830e-04
  ADC_P2  : -4.58216e-06 ± 2.37962e-06
  CSA_Chi2/NDF : 1.38090e-04 / 2
  CSA_P0  : 5.76537e-02 ± 7.83798e-03
  CSA_P1  : 9.70634e-03 ± 5.90535e-04
  CSA_P2  : -4.35954e-05 ± 8.99315e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [19, 23, 26, 28, 33, 37, 54]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [3, 6, 30, 68, 73, 94, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1880', '1.800', '0.1494', '1.800', '0.0816', '7.000', '0.7070', 1, 1, 1, 1, 1725264994.6881318]
VI_after__Init : ['1.202', '0.1880', '1.800', '0.1492', '1.800', '0.0761', '7.000', '0.7070', 1, 1, 1, 1, 1725265002.7055078]
VI_at__the_End : ['1.202', '0.4919', '1.800', '0.1339', '1.800', '0.1118', '7.000', '0.7078', 1, 1, 1, 1, 1725265063.0278072]