TEST_NAME : Wafer
TEST_DATE : 24_09_02-10_18_11
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-018-019-11 | FUSED_ID : 6359364768390783291
  IC_TEMP :  -58.60 | VDDM : 1130.17 | AUX_INT :   -8.26 | CsaBias :   83.86
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.15056e-03 / 2
  ADC_P0  : -8.26176e-03 ± 2.29170e-02
  ADC_P1  : 8.45028e-03 ± 5.52314e-04
  ADC_P2  : -6.86926e-06 ± 2.62721e-06
  CSA_Chi2/NDF : 1.05987e-04 / 2
  CSA_P0  : 6.05158e-02 ± 6.86670e-03
  CSA_P1  : 9.21965e-03 ± 5.17356e-04
  CSA_P2  : -3.61186e-05 ± 7.87872e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [15, 64, 78, 88, 93, 101, 102]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [44, 79, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4714', '1.800', '0.1497', '1.800', '0.0987', '7.000', '0.7079', 1, 1, 1, 1, 1725265091.430691]
VI_after__Init : ['1.202', '0.4713', '1.800', '0.1495', '1.800', '0.0910', '7.000', '0.7071', 1, 1, 1, 1, 1725265099.5821047]
VI_at__the_End : ['1.201', '0.4943', '1.800', '0.1371', '1.799', '0.1121', '7.000', '0.7079', 1, 1, 1, 1, 1725265160.6592355]