TEST_NAME : Wafer
TEST_DATE : 24_09_02-20_51_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-011-010-00 | FUSED_ID : 6359364768391803040
  IC_TEMP :  -50.65 | VDDM : 1128.67 | AUX_INT :   -8.20 | CsaBias :   78.40
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.16075e-03 / 2
  ADC_P0  : -8.19741e-03 ± 2.30786e-02
  ADC_P1  : 7.92954e-03 ± 5.37297e-04
  ADC_P2  : -5.15076e-06 ± 2.48127e-06
  CSA_Chi2/NDF : 7.73702e-05 / 2
  CSA_P0  : 5.75297e-02 ± 5.86691e-03
  CSA_P1  : 9.31685e-03 ± 4.42029e-04
  CSA_P2  : -3.97628e-05 ± 6.73158e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [2, 7, 9, 83, 120, 122, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [81, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3418', '1.799', '0.1150', '1.800', '0.0894', '7.000', '0.7076', 1, 1, 1, 1, 1725303098.502471]
VI_after__Init : ['1.201', '0.3419', '1.800', '0.1147', '1.800', '0.0835', '7.000', '0.7072', 1, 1, 1, 1, 1725303107.3837574]
VI_at__the_End : ['1.201', '0.4838', '1.800', '0.1348', '1.799', '0.1120', '7.000', '0.7083', 1, 1, 1, 1, 1725303172.2077272]