TEST_NAME : Wafer
TEST_DATE : 24_09_02-21_12_33
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-012-006-08 | FUSED_ID : 6359364768391807080
  IC_TEMP :  -54.44 | VDDM : 1128.53 | AUX_INT :   -7.95 | CsaBias :   81.70
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21165e-03 / 2
  ADC_P0  : -7.95408e-03 ± 2.35952e-02
  ADC_P1  : 8.20986e-03 ± 5.71662e-04
  ADC_P2  : -5.39031e-06 ± 2.74503e-06
  CSA_Chi2/NDF : 2.18851e-04 / 2
  CSA_P0  : 5.93700e-02 ± 9.86726e-03
  CSA_P1  : 9.95297e-03 ± 7.43427e-04
  CSA_P2  : -4.86526e-05 ± 1.13215e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [4, 14, 21, 38, 57, 74, 83, 91, 103, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [6, 20, 25, 48, 51, 91, 110, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3268', '1.800', '0.1400', '1.800', '0.0935', '7.000', '0.7075', 1, 1, 1, 1, 1725304352.816508]
VI_after__Init : ['1.201', '0.3268', '1.800', '0.1399', '1.800', '0.0877', '7.000', '0.7074', 1, 1, 1, 1, 1725304360.791798]
VI_at__the_End : ['1.201', '0.4940', '1.800', '0.1400', '1.805', '0.1132', '7.000', '0.7078', 1, 1, 1, 1, 1725304425.5198262]