TEST_NAME : Wafer
TEST_DATE : 24_09_02-23_35_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-015-006-06 | FUSED_ID : 6359364768391819366
  IC_TEMP :  -55.08 | VDDM : 1122.27 | AUX_INT :   -9.00 | CsaBias :   74.55
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43843e-03 / 2
  ADC_P0  : -8.99918e-03 ± 2.57531e-02
  ADC_P1  : 8.40613e-03 ± 6.43350e-04
  ADC_P2  : -5.15136e-06 ± 3.20312e-06
  CSA_Chi2/NDF : 1.76669e-04 / 2
  CSA_P0  : 5.90846e-02 ± 8.86549e-03
  CSA_P1  : 1.01844e-02 ± 6.67951e-04
  CSA_P2  : -5.09249e-05 ± 1.01721e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2877', '1.800', '0.1175', '1.800', '0.0863', '7.000', '0.7078', 1, 1, 1, 1, 1725312922.9020886]
VI_after__Init : ['1.199', '0.2875', '1.800', '0.1175', '1.800', '0.0806', '7.000', '0.7076', 1, 1, 1, 1, 1725312931.0084784]
VI_at__the_End : ['1.201', '0.4929', '1.800', '0.1370', '1.803', '0.1114', '7.000', '0.7083', 1, 1, 1, 1, 1725312993.714714]