TEST_NAME : Wafer
TEST_DATE : 24_09_03-13_34_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-011-021-15 | FUSED_ID : 6359364768392851807
  IC_TEMP :  -49.49 | VDDM : 1137.33 | AUX_INT :   -5.10 | CsaBias :   78.94
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.40753e-04 / 2
  ADC_P0  : -5.10344e-03 ± 1.84550e-02
  ADC_P1  : 8.45376e-03 ± 4.75428e-04
  ADC_P2  : -4.96349e-06 ± 2.41571e-06
  CSA_Chi2/NDF : 9.64667e-05 / 2
  CSA_P0  : 6.14551e-02 ± 6.55105e-03
  CSA_P1  : 9.88100e-03 ± 4.93574e-04
  CSA_P2  : -4.39897e-05 ± 7.51656e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [8, 13, 14, 23, 29, 49, 56, 61, 82, 88, 102, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [1, 10, 24, 92, 117, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.1447', '1.800', '0.1791', '1.800', '0.0823', '7.004', '0.7074', 1, 1, 1, 1, 1725363245.634737]
VI_after__Init : ['1.202', '0.1446', '1.800', '0.1790', '1.799', '0.0766', '7.000', '0.7081', 1, 1, 1, 1, 1725363253.671213]
VI_at__the_End : ['1.202', '0.5059', '1.800', '0.1393', '1.799', '0.1114', '7.000', '0.7084', 1, 1, 1, 1, 1725363314.1915011]