TEST_NAME : Wafer
TEST_DATE : 24_09_05-09_48_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-005-004-03 | FUSED_ID : 6359364768394924099
  IC_TEMP :  -62.21 | VDDM : 1122.35 | AUX_INT :   -9.85 | CsaBias :   66.39
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.57450e-03 / 2
  ADC_P0  : -9.85329e-03 ± 2.68948e-02
  ADC_P1  : 8.52782e-03 ± 6.62371e-04
  ADC_P2  : -6.23574e-06 ± 3.24806e-06
  CSA_Chi2/NDF : 1.80848e-04 / 2
  CSA_P0  : 5.86806e-02 ± 8.96972e-03
  CSA_P1  : 1.03645e-02 ± 6.75804e-04
  CSA_P2  : -5.33646e-05 ± 1.02917e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [45, 58, 101]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [45, 46, 50, 66, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2878', '1.800', '0.1149', '1.800', '0.0881', '7.000', '0.7080', 1, 1, 1, 1, 1725522518.6482892]
VI_after__Init : ['1.202', '0.2880', '1.800', '0.1147', '1.799', '0.0826', '7.000', '0.7074', 1, 1, 1, 1, 1725522526.753678]
VI_at__the_End : ['1.202', '0.4961', '1.800', '0.1413', '1.804', '0.1160', '6.999', '0.7085', 1, 1, 1, 1, 1725522586.6027386]