TEST_NAME : Wafer
TEST_DATE : 24_09_05-09_51_45
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-006-004-13 | FUSED_ID : 6359364768394928205
  IC_TEMP :  -60.75 | VDDM : 1128.76 | AUX_INT :   -8.08 | CsaBias :   69.44
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09428e-03 / 2
  ADC_P0  : -8.08220e-03 ± 2.24028e-02
  ADC_P1  : 8.66791e-03 ± 5.71453e-04
  ADC_P2  : -6.03627e-06 ± 2.89289e-06
  CSA_Chi2/NDF : 1.83548e-04 / 2
  CSA_P0  : 5.94341e-02 ± 9.03644e-03
  CSA_P1  : 1.05095e-02 ± 6.80831e-04
  CSA_P2  : -5.51671e-05 ± 1.03682e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [53, 69, 82, 91, 103, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [57, 80, 88, 98, 99, 100, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2360', '1.800', '0.0817', '1.800', '0.0984', '7.000', '0.7083', 1, 1, 1, 1, 1725522704.8846862]
VI_after__Init : ['1.202', '0.2363', '1.800', '0.0817', '1.800', '0.0913', '7.000', '0.7076', 1, 1, 1, 1, 1725522713.071072]
VI_at__the_End : ['1.202', '0.4980', '1.800', '0.1423', '1.806', '0.1160', '7.000', '0.7085', 1, 1, 1, 1, 1725522771.9531193]