TEST_NAME : Wafer
TEST_DATE : 24_09_05-12_59_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-010-020-00 | FUSED_ID : 6359364768394944832
  IC_TEMP :  -53.48 | VDDM : 1144.46 | AUX_INT : -164.26 | CsaBias :  -36.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.03507e-04 / 2
  ADC_P0  : -1.64256e-01 ± 2.73208e-02
  ADC_P1  : 1.07728e-02 ± 6.40497e-04
  ADC_P2  : -1.39462e-05 ± 2.94834e-06
  CSA_Chi2/NDF : 1.02991e-04 / 2
  CSA_P0  : 6.13876e-02 ± 6.76897e-03
  CSA_P1  : 1.00170e-02 ± 5.09993e-04
  CSA_P2  : -4.67821e-05 ± 7.76659e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [11, 19, 53, 82, 96, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [0, 16, 39, 50, 57, 67]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2553', '1.800', '0.1760', '1.800', '0.0905', '7.000', '0.7072', 1, 1, 1, 1, 1725533993.7557714]
VI_after__Init : ['1.201', '0.2554', '1.800', '0.1760', '1.800', '0.0848', '7.000', '0.7073', 1, 1, 1, 1, 1725534002.0682192]
VI_at__the_End : ['1.201', '0.5008', '1.800', '0.1396', '1.800', '0.1105', '7.000', '0.7079', 1, 1, 1, 1, 1725534062.07345]