TEST_NAME : Wafer
TEST_DATE : 24_09_05-14_05_36
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-012-009-02 | FUSED_ID : 6359364768394952850
  IC_TEMP :  -53.93 | VDDM : 1124.91 | AUX_INT :   -7.73 | CsaBias :   66.92
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.09222e-04 / 2
  ADC_P0  : -7.72617e-03 ± 2.03695e-02
  ADC_P1  : 8.35002e-03 ± 4.92304e-04
  ADC_P2  : -6.19056e-06 ± 2.35676e-06
  CSA_Chi2/NDF : 1.32934e-04 / 2
  CSA_P0  : 5.94470e-02 ± 7.69026e-03
  CSA_P1  : 9.82595e-03 ± 5.79406e-04
  CSA_P2  : -4.76713e-05 ± 8.82366e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [35, 40, 55]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [2, 25, 47, 52, 54, 73, 106, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2906', '1.800', '0.1565', '1.800', '0.0937', '7.000', '0.7069', 1, 1, 1, 1, 1725537935.4535406]
VI_after__Init : ['1.202', '0.2906', '1.800', '0.1566', '1.800', '0.0880', '7.000', '0.7068', 1, 1, 1, 1, 1725537943.7489507]
VI_at__the_End : ['1.201', '0.4875', '1.800', '0.1380', '1.809', '0.1122', '7.000', '0.7076', 1, 1, 1, 1, 1725538003.928393]