TEST_NAME : Wafer
TEST_DATE : 24_09_05-14_23_19
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-012-020-05 | FUSED_ID : 6359364768394953029
  IC_TEMP :  -59.00 | VDDM : 1129.79 | AUX_INT :   -6.25 | CsaBias :   61.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.05271e-03 / 2
  ADC_P0  : -6.24795e-03 ± 2.19686e-02
  ADC_P1  : 8.48245e-03 ± 5.48023e-04
  ADC_P2  : -6.05905e-06 ± 2.69930e-06
  CSA_Chi2/NDF : 1.78961e-04 / 2
  CSA_P0  : 5.99250e-02 ± 8.92282e-03
  CSA_P1  : 1.01574e-02 ± 6.72270e-04
  CSA_P2  : -5.22909e-05 ± 1.02379e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [2, 33, 42, 51, 75, 88, 111, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [4, 31, 59, 77, 82, 105, 121, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.3619', '1.800', '0.1648', '1.800', '0.0886', '7.000', '0.7088', 1, 1, 1, 1, 1725538998.4922807]
VI_after__Init : ['1.202', '0.3616', '1.800', '0.1649', '1.800', '0.0814', '7.000', '0.7077', 1, 1, 1, 1, 1725539007.200619]
VI_at__the_End : ['1.202', '0.4897', '1.800', '0.1393', '1.802', '0.1133', '7.000', '0.7085', 1, 1, 1, 1, 1725539066.426384]