TEST_NAME : Wafer
TEST_DATE : 24_09_05-14_24_56
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-012-021-05 | FUSED_ID : 6359364768394953045
  IC_TEMP :  -54.72 | VDDM : 1106.47 | AUX_INT :  -62.93 | CsaBias :   26.49
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.60411e-03 / 2
  ADC_P0  : -6.29339e-02 ± 3.02296e-02
  ADC_P1  : 9.02477e-03 ± 7.13098e-04
  ADC_P2  : -8.19139e-06 ± 3.32444e-06
  CSA_Chi2/NDF : 1.42791e-04 / 2
  CSA_P0  : 5.97901e-02 ± 7.97026e-03
  CSA_P1  : 1.02362e-02 ± 6.00502e-04
  CSA_P2  : -5.22193e-05 ± 9.14493e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [8, 18, 21, 30, 41, 46, 64, 78, 99, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [4, 97, 103, 121, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1695', '1.800', '0.1526', '1.799', '0.0897', '7.000', '0.7077', 1, 1, 1, 1, 1725539095.6458995]
VI_after__Init : ['1.202', '0.1693', '1.800', '0.1526', '1.800', '0.0842', '7.000', '0.7080', 1, 1, 1, 1, 1725539103.734175]
VI_at__the_End : ['1.202', '0.4935', '1.800', '0.1404', '1.800', '0.1133', '7.000', '0.7088', 1, 1, 1, 1, 1725539171.5603445]