TEST_NAME : Wafer
TEST_DATE : 24_09_05-14_34_34
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-012-027-05 | FUSED_ID : 6359364768394953141
  IC_TEMP :  -50.93 | VDDM : 1124.83 | AUX_INT :   -6.65 | CsaBias :   79.51
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10092e-03 / 2
  ADC_P0  : -6.64919e-03 ± 2.24920e-02
  ADC_P1  : 7.88628e-03 ± 5.26336e-04
  ADC_P2  : -4.84325e-06 ± 2.44143e-06
  CSA_Chi2/NDF : 7.70120e-05 / 2
  CSA_P0  : 5.63224e-02 ± 5.85331e-03
  CSA_P1  : 9.39241e-03 ± 4.41005e-04
  CSA_P2  : -3.89653e-05 ± 6.71598e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [57, 64, 69, 79, 98, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [44, 45, 51, 67, 80, 117, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4054', '1.800', '0.1376', '1.800', '0.0943', '7.000', '0.7073', 1, 1, 1, 1, 1725539674.354813]
VI_after__Init : ['1.202', '0.4054', '1.800', '0.1376', '1.800', '0.0886', '7.000', '0.7073', 1, 1, 1, 1, 1725539682.4362547]
VI_at__the_End : ['1.202', '0.4903', '1.800', '0.1305', '1.800', '0.1118', '7.000', '0.7082', 1, 1, 1, 1, 1725539750.248718]