TEST_NAME : Wafer
TEST_DATE : 24_09_10-09_39_12
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-002-017-05 | FUSED_ID : 6359364768397009173
  IC_TEMP :  -61.74 | VDDM : 1123.28 | AUX_INT :   -8.37 | CsaBias :   75.35
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.19762e-03 / 2
  ADC_P0  : -8.36653e-03 ± 2.33810e-02
  ADC_P1  : 8.43961e-03 ± 5.63497e-04
  ADC_P2  : -6.81859e-06 ± 2.68040e-06
  CSA_Chi2/NDF : 1.16989e-04 / 2
  CSA_P0  : 5.75191e-02 ± 7.21433e-03
  CSA_P1  : 9.65646e-03 ± 5.43547e-04
  CSA_P2  : -4.38597e-05 ± 8.27758e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [0, 10, 22, 103]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [5, 50, 53, 54, 56, 80, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2244', '1.800', '0.1248', '1.799', '0.0828', '7.000', '0.7074', 1, 1, 1, 1, 1725953951.495657]
VI_after__Init : ['1.201', '0.2244', '1.800', '0.1248', '1.799', '0.0772', '7.000', '0.7073', 1, 1, 1, 1, 1725953960.0020487]
VI_at__the_End : ['1.201', '0.4851', '1.800', '0.1374', '1.806', '0.1149', '7.000', '0.7084', 1, 1, 1, 1, 1725954028.0680532]