TEST_NAME : Wafer
TEST_DATE : 24_09_10-09_42_24
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-002-019-05 | FUSED_ID : 6359364768397009205
  IC_TEMP :  -63.21 | VDDM : 1116.28 | AUX_INT :   -8.54 | CsaBias :   68.01
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.15022e-03 / 2
  ADC_P0  : -8.54224e-03 ± 2.29353e-02
  ADC_P1  : 8.56465e-03 ± 5.67761e-04
  ADC_P2  : -6.51678e-06 ± 2.78595e-06
  CSA_Chi2/NDF : 1.25032e-04 / 2
  CSA_P0  : 5.79242e-02 ± 7.45818e-03
  CSA_P1  : 9.56202e-03 ± 5.61920e-04
  CSA_P2  : -4.39669e-05 ± 8.55738e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [12, 36, 54, 57, 60, 83, 84, 88, 105]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [2, 10, 15, 30, 42, 57, 81, 113, 119, 124, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2791', '1.800', '0.1730', '1.799', '0.0905', '7.000', '0.7072', 1, 1, 1, 1, 1725954144.4194698]
VI_after__Init : ['1.201', '0.2793', '1.800', '0.1731', '1.800', '0.0852', '7.000', '0.7070', 1, 1, 1, 1, 1725954152.8548295]
VI_at__the_End : ['1.201', '0.4820', '1.800', '0.1370', '1.800', '0.1171', '7.000', '0.7076', 1, 1, 1, 1, 1725954221.357795]