TEST_NAME : Wafer
TEST_DATE : 24_09_10-10_08_13
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-003-007-15 | FUSED_ID : 6359364768397013119
  IC_TEMP :  -60.02 | VDDM : 1125.77 | AUX_INT :  -10.30 | CsaBias :   67.40
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.55790e-03 / 2
  ADC_P0  : -1.03032e-02 ± 2.67007e-02
  ADC_P1  : 8.69566e-03 ± 6.61753e-04
  ADC_P2  : -6.88830e-06 ± 3.26509e-06
  CSA_Chi2/NDF : 1.52629e-04 / 2
  CSA_P0  : 5.70040e-02 ± 8.24027e-03
  CSA_P1  : 1.01005e-02 ± 6.20845e-04
  CSA_P2  : -4.82977e-05 ± 9.45473e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [27, 90, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [11, 19, 27, 34, 51, 54, 67, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4410', '1.800', '0.1787', '1.800', '0.1019', '7.000', '0.7082', 1, 1, 1, 1, 1725955693.229911]
VI_after__Init : ['1.202', '0.4416', '1.800', '0.1788', '1.799', '0.0959', '7.000', '0.7079', 1, 1, 1, 1, 1725955701.3691957]
VI_at__the_End : ['1.202', '0.4974', '1.800', '0.1412', '1.800', '0.1158', '7.000', '0.7087', 1, 1, 1, 1, 1725955762.2586854]