TEST_NAME : Wafer
TEST_DATE : 24_09_10-10_06_36
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-003-008-15 | FUSED_ID : 6359364768397013135
  IC_TEMP :  -58.83 | VDDM : 1124.95 | AUX_INT :   -8.95 | CsaBias :   84.98
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.37018e-03 / 2
  ADC_P0  : -8.94521e-03 ± 2.50710e-02
  ADC_P1  : 8.60868e-03 ± 6.26230e-04
  ADC_P2  : -6.40008e-06 ± 3.10200e-06
  CSA_Chi2/NDF : 1.36994e-04 / 2
  CSA_P0  : 5.92736e-02 ± 7.80679e-03
  CSA_P1  : 9.61986e-03 ± 5.88185e-04
  CSA_P2  : -4.15763e-05 ± 8.95737e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [4, 80, 84, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [29, 67, 69, 84, 91, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2917', '1.800', '0.1578', '1.800', '0.0879', '7.000', '0.7087', 1, 1, 1, 1, 1725955595.9853]
VI_after__Init : ['1.202', '0.2918', '1.800', '0.1578', '1.800', '0.0804', '7.000', '0.7078', 1, 1, 1, 1, 1725955604.7196264]
VI_at__the_End : ['1.201', '0.4978', '1.800', '0.1394', '1.800', '0.1138', '7.000', '0.7090', 1, 1, 1, 1, 1725955671.1595757]