TEST_NAME : Wafer
TEST_DATE : 24_09_10-09_44_01
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-003-022-08 | FUSED_ID : 6359364768397013352
  IC_TEMP :  -54.86 | VDDM : 1122.54 | AUX_INT :   -7.03 | CsaBias :   65.54
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.07572e-03 / 2
  ADC_P0  : -7.03075e-03 ± 2.22719e-02
  ADC_P1  : 8.10356e-03 ± 5.47188e-04
  ADC_P2  : -4.42219e-06 ± 2.66654e-06
  CSA_Chi2/NDF : 1.52575e-04 / 2
  CSA_P0  : 5.67863e-02 ± 8.23879e-03
  CSA_P1  : 1.02442e-02 ± 6.20733e-04
  CSA_P2  : -5.00418e-05 ± 9.45303e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [15, 16, 40, 45, 66, 83, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [8, 12, 60, 62, 91]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2087', '1.800', '0.1172', '1.800', '0.0828', '7.000', '0.7072', 1, 1, 1, 1, 1725954241.0463448]
VI_after__Init : ['1.201', '0.2087', '1.800', '0.1172', '1.799', '0.0775', '7.000', '0.7068', 1, 1, 1, 1, 1725954249.6587193]
VI_at__the_End : ['1.201', '0.4963', '1.800', '0.1368', '1.800', '0.1141', '7.000', '0.7079', 1, 1, 1, 1, 1725954313.1149547]