TEST_NAME : Wafer
TEST_DATE : 24_09_10-10_17_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-004-011-07 | FUSED_ID : 6359364768397017271
  IC_TEMP :  -54.63 | VDDM : 1125.62 | AUX_INT :   -7.15 | CsaBias :   80.32
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.97511e-04 / 2
  ADC_P0  : -7.15080e-03 ± 2.13795e-02
  ADC_P1  : 8.01085e-03 ± 5.04411e-04
  ADC_P2  : -5.32536e-06 ± 2.35158e-06
  CSA_Chi2/NDF : 9.54414e-05 / 2
  CSA_P0  : 5.76292e-02 ± 6.51614e-03
  CSA_P1  : 9.16669e-03 ± 4.90944e-04
  CSA_P2  : -3.51715e-05 ± 7.47650e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [3, 31, 73, 80, 85, 87, 89, 100, 101, 112, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [24, 103, 108, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3484', '1.800', '0.1477', '1.800', '0.0914', '7.000', '0.7082', 1, 1, 1, 1, 1725956272.2389653]
VI_after__Init : ['1.201', '0.3484', '1.800', '0.1477', '1.800', '0.0857', '7.000', '0.7081', 1, 1, 1, 1, 1725956280.4193556]
VI_at__the_End : ['1.202', '0.4898', '1.800', '0.1350', '1.799', '0.1120', '7.000', '0.7086', 1, 1, 1, 1, 1725956340.8217084]