TEST_NAME : Wafer
TEST_DATE : 24_09_10-10_22_42
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-004-014-07 | FUSED_ID : 6359364768397017319
  IC_TEMP :  -46.13 | VDDM : 1126.80 | AUX_INT :  -70.23 | CsaBias :   44.48
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.47026e-03 / 2
  ADC_P0  : -7.02295e-02 ± 2.95909e-02
  ADC_P1  : 8.92032e-03 ± 6.99860e-04
  ADC_P2  : -7.45078e-06 ± 3.25971e-06
  CSA_Chi2/NDF : 1.09516e-04 / 2
  CSA_P0  : 5.80021e-02 ± 6.98009e-03
  CSA_P1  : 9.70703e-03 ± 5.25900e-04
  CSA_P2  : -4.16165e-05 ± 8.00883e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [26, 78, 93, 102, 107, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [11, 90, 109, 115, 118, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2684', '1.800', '0.1533', '1.800', '0.0905', '7.000', '0.7090', 1, 1, 1, 1, 1725956561.9538798]
VI_after__Init : ['1.202', '0.2684', '1.800', '0.1533', '1.800', '0.0831', '7.000', '0.7081', 1, 1, 1, 1, 1725956570.0011964]
VI_at__the_End : ['1.202', '0.5007', '1.800', '0.1378', '1.802', '0.1114', '7.000', '0.7093', 1, 1, 1, 1, 1725956634.7214515]