TEST_NAME : Wafer
TEST_DATE : 24_09_10-10_30_47
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-004-019-00 | FUSED_ID : 6359364768397017392
  IC_TEMP :  -51.69 | VDDM : 1130.47 | AUX_INT :   -6.57 | CsaBias :   81.82
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.33567e-04 / 2
  ADC_P0  : -6.56834e-03 ± 2.07113e-02
  ADC_P1  : 8.08851e-03 ± 5.02775e-04
  ADC_P2  : -4.85662e-06 ± 2.41418e-06
  CSA_Chi2/NDF : 1.17587e-04 / 2
  CSA_P0  : 6.08751e-02 ± 7.23273e-03
  CSA_P1  : 9.87839e-03 ± 5.44934e-04
  CSA_P2  : -4.49277e-05 ± 8.29871e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [8, 11, 22, 65, 78, 85, 104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [28, 53, 59, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4188', '1.800', '0.1612', '1.800', '0.0927', '7.000', '0.7079', 1, 1, 1, 1, 1725957046.9360726]
VI_after__Init : ['1.202', '0.4190', '1.800', '0.1613', '1.800', '0.0870', '7.000', '0.7079', 1, 1, 1, 1, 1725957054.9765034]
VI_at__the_End : ['1.201', '0.5018', '1.800', '0.1408', '1.801', '0.1121', '7.000', '0.7088', 1, 1, 1, 1, 1725957122.5784054]