TEST_NAME : Wafer
TEST_DATE : 24_09_10-10_56_34
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-005-014-10 | FUSED_ID : 6359364768397021418
  IC_TEMP :  -53.22 | VDDM : 1129.56 | AUX_INT :   -8.37 | CsaBias :   82.92
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10097e-03 / 2
  ADC_P0  : -8.37016e-03 ± 2.24558e-02
  ADC_P1  : 8.36294e-03 ± 5.49267e-04
  ADC_P2  : -5.76690e-06 ± 2.66856e-06
  CSA_Chi2/NDF : 1.17509e-04 / 2
  CSA_P0  : 5.96517e-02 ± 7.23032e-03
  CSA_P1  : 9.68095e-03 ± 5.44752e-04
  CSA_P2  : -4.15635e-05 ± 8.29593e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [1, 3, 31, 37, 41, 67, 92]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [46, 47, 100]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3603', '1.800', '0.1430', '1.800', '0.0914', '7.000', '0.7069', 1, 1, 1, 1, 1725958594.393493]
VI_after__Init : ['1.201', '0.3606', '1.800', '0.1430', '1.800', '0.0856', '7.000', '0.7072', 1, 1, 1, 1, 1725958602.5198538]
VI_at__the_End : ['1.201', '0.4969', '1.800', '0.1401', '1.805', '0.1112', '7.000', '0.7078', 1, 1, 1, 1, 1725958671.227357]