TEST_NAME : Wafer
TEST_DATE : 24_09_10-10_50_07
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-005-018-13 | FUSED_ID : 6359364768397021485
  IC_TEMP :  -55.71 | VDDM : 1123.17 | AUX_INT :   -9.13 | CsaBias :   80.12
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.68968e-03 / 2
  ADC_P0  : -9.12972e-03 ± 2.79149e-02
  ADC_P1  : 8.17236e-03 ± 6.70794e-04
  ADC_P2  : -5.32331e-06 ± 3.20137e-06
  CSA_Chi2/NDF : 1.22489e-04 / 2
  CSA_P0  : 5.97652e-02 ± 7.38195e-03
  CSA_P1  : 9.69021e-03 ± 5.56177e-04
  CSA_P2  : -4.42830e-05 ± 8.46991e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [7, 23, 36, 38, 95, 100, 117, 120, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [65, 81, 91, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3648', '1.800', '0.1209', '1.800', '0.0891', '7.000', '0.7072', 1, 1, 1, 1, 1725958207.6811798]
VI_after__Init : ['1.202', '0.3649', '1.800', '0.1210', '1.799', '0.0835', '7.000', '0.7072', 1, 1, 1, 1, 1725958215.7655513]
VI_at__the_End : ['1.202', '0.4893', '1.800', '0.1366', '1.802', '0.1152', '7.000', '0.7079', 1, 1, 1, 1, 1725958276.0687153]