TEST_NAME : Wafer
TEST_DATE : 24_09_10-10_45_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-005-021-13 | FUSED_ID : 6359364768397021533
  IC_TEMP :  -47.78 | VDDM : 1122.83 | AUX_INT :  -16.15 | CsaBias :   72.50
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.68624e-03 / 2
  ADC_P0  : -1.61477e-02 ± 2.84181e-02
  ADC_P1  : 8.11345e-03 ± 6.81973e-04
  ADC_P2  : -4.93675e-06 ± 3.23626e-06
  CSA_Chi2/NDF : 1.00320e-04 / 2
  CSA_P0  : 5.71303e-02 ± 6.68062e-03
  CSA_P1  : 9.54430e-03 ± 5.03336e-04
  CSA_P2  : -4.03144e-05 ± 7.66522e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [25, 28, 80, 81, 88, 101, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [4, 22, 79, 85, 96]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1439', '1.800', '0.1300', '1.800', '0.0814', '7.000', '0.7082', 1, 1, 1, 1, 1725957917.9738784]
VI_after__Init : ['1.202', '0.1439', '1.800', '0.1300', '1.800', '0.0740', '7.000', '0.7076', 1, 1, 1, 1, 1725957926.2341475]
VI_at__the_End : ['1.202', '0.4941', '1.800', '0.1344', '1.801', '0.1114', '7.000', '0.7083', 1, 1, 1, 1, 1725957995.6445515]