TEST_NAME : Wafer
TEST_DATE : 24_09_10-10_40_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-005-024-13 | FUSED_ID : 6359364768397021581
  IC_TEMP :  -53.38 | VDDM : 1127.28 | AUX_INT :   -8.72 | CsaBias :   76.23
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17080e-03 / 2
  ADC_P0  : -8.71907e-03 ± 2.31469e-02
  ADC_P1  : 8.55766e-03 ± 5.74856e-04
  ADC_P2  : -6.26533e-06 ± 2.83671e-06
  CSA_Chi2/NDF : 1.30246e-04 / 2
  CSA_P0  : 6.07840e-02 ± 7.61211e-03
  CSA_P1  : 9.66415e-03 ± 5.73518e-04
  CSA_P2  : -4.18270e-05 ± 8.73400e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [6, 9, 34, 66, 68, 71, 99, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [45, 64, 78, 79, 80, 87, 98, 104, 111, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2596', '1.800', '0.1545', '1.799', '0.0852', '7.000', '0.7078', 1, 1, 1, 1, 1725957627.402436]
VI_after__Init : ['1.201', '0.2596', '1.800', '0.1545', '1.800', '0.0796', '7.000', '0.7081', 1, 1, 1, 1, 1725957635.430825]
VI_at__the_End : ['1.202', '0.5008', '1.800', '0.1389', '1.804', '0.1122', '7.000', '0.7083', 1, 1, 1, 1, 1725957706.3416433]