TEST_NAME : Wafer
TEST_DATE : 24_09_10-11_17_34
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-006-005-04 | FUSED_ID : 6359364768397025364
  IC_TEMP :  -60.22 | VDDM : 1121.42 | AUX_INT :   -6.92 | CsaBias :   70.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.05943e-04 / 2
  ADC_P0  : -6.92497e-03 ± 2.03547e-02
  ADC_P1  : 8.61405e-03 ± 5.13930e-04
  ADC_P2  : -6.38258e-06 ± 2.55960e-06
  CSA_Chi2/NDF : 1.60525e-04 / 2
  CSA_P0  : 5.86799e-02 ± 8.45072e-03
  CSA_P1  : 9.81595e-03 ± 6.36701e-04
  CSA_P2  : -4.61188e-05 ± 9.69620e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [22, 25, 29, 54, 97, 112, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [13, 23, 24, 33, 34, 43, 76, 107, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1820', '1.800', '0.1450', '1.800', '0.0834', '7.000', '0.7074', 1, 1, 1, 1, 1725959854.1231859]
VI_after__Init : ['1.202', '0.1820', '1.800', '0.1450', '1.801', '0.0778', '7.000', '0.7074', 1, 1, 1, 1, 1725959862.2846148]
VI_at__the_End : ['1.202', '0.4896', '1.800', '0.1413', '1.800', '0.1140', '7.000', '0.7083', 1, 1, 1, 1, 1725959920.7033799]