TEST_NAME : Wafer
TEST_DATE : 24_09_10-11_20_48
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-006-007-04 | FUSED_ID : 6359364768397025396
  IC_TEMP :  -56.67 | VDDM : 1120.73 | AUX_INT :   -6.69 | CsaBias :   83.36
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.13490e-04 / 2
  ADC_P0  : -6.68986e-03 ± 1.92966e-02
  ADC_P1  : 8.24604e-03 ± 4.71431e-04
  ADC_P2  : -5.45250e-06 ± 2.27779e-06
  CSA_Chi2/NDF : 1.57767e-04 / 2
  CSA_P0  : 5.68278e-02 ± 8.37780e-03
  CSA_P1  : 9.98313e-03 ± 6.31207e-04
  CSA_P2  : -4.74323e-05 ± 9.61253e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [10, 11, 46, 67, 76, 87]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [41, 92, 98, 106, 107, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1242', '1.800', '0.1682', '1.799', '0.0821', '7.000', '0.7076', 1, 1, 1, 1, 1725960047.4259174]
VI_after__Init : ['1.201', '0.1242', '1.800', '0.1678', '1.800', '0.0765', '7.000', '0.7078', 1, 1, 1, 1, 1725960056.4102514]
VI_at__the_End : ['1.201', '0.4899', '1.800', '0.1397', '1.800', '0.1128', '7.000', '0.7087', 1, 1, 1, 1, 1725960118.992546]