TEST_NAME : Wafer
TEST_DATE : 24_09_10-11_27_16
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-006-011-04 | FUSED_ID : 6359364768397025460
  IC_TEMP :  -58.86 | VDDM : 1107.93 | AUX_INT :  -64.38 | CsaBias :   35.58
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.44763e-03 / 2
  ADC_P0  : -6.43779e-02 ± 2.86998e-02
  ADC_P1  : 9.18378e-03 ± 6.82555e-04
  ADC_P2  : -8.83163e-06 ± 3.19833e-06
  CSA_Chi2/NDF : 1.26775e-04 / 2
  CSA_P0  : 5.98519e-02 ± 7.50998e-03
  CSA_P1  : 9.66668e-03 ± 5.65823e-04
  CSA_P2  : -4.60032e-05 ± 8.61681e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [14, 49, 100]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [4, 16, 59, 61, 63, 72, 92]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2744', '1.800', '0.1391', '1.800', '0.0866', '7.000', '0.7076', 1, 1, 1, 1, 1725960435.4897044]
VI_after__Init : ['1.202', '0.2743', '1.800', '0.1391', '1.800', '0.0813', '7.000', '0.7076', 1, 1, 1, 1, 1725960444.322057]
VI_at__the_End : ['1.202', '0.4819', '1.800', '0.1382', '1.800', '0.1135', '7.000', '0.7086', 1, 1, 1, 1, 1725960513.9566758]