TEST_NAME : Wafer
TEST_DATE : 24_09_10-11_30_29
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-006-013-04 | FUSED_ID : 6359364768397025492
  IC_TEMP :  -52.01 | VDDM : 1128.60 | AUX_INT :   -5.03 | CsaBias :   75.78
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.92325e-04 / 2
  ADC_P0  : -5.02981e-03 ± 1.90812e-02
  ADC_P1  : 8.12840e-03 ± 4.72165e-04
  ADC_P2  : -4.69986e-06 ± 2.29990e-06
  CSA_Chi2/NDF : 8.01993e-05 / 2
  CSA_P0  : 5.88186e-02 ± 5.97321e-03
  CSA_P1  : 9.46292e-03 ± 4.50038e-04
  CSA_P2  : -3.99704e-05 ± 6.85355e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [30, 33, 40, 47, 66, 70]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [23, 62, 69, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1845', '1.800', '0.1559', '1.799', '0.0891', '7.000', '0.7078', 1, 1, 1, 1, 1725960629.552878]
VI_after__Init : ['1.202', '0.1845', '1.800', '0.1558', '1.800', '0.0834', '7.000', '0.7078', 1, 1, 1, 1, 1725960637.7263026]
VI_at__the_End : ['1.198', '0.4928', '1.800', '0.1363', '1.799', '0.1111', '7.000', '0.7086', 1, 1, 1, 1, 1725960706.2410004]