TEST_NAME : Wafer
TEST_DATE : 24_09_10-11_46_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-006-023-03 | FUSED_ID : 6359364768397025651
  IC_TEMP :  -47.96 | VDDM : 1124.80 | AUX_INT :   -7.79 | CsaBias :   84.93
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.20473e-03 / 2
  ADC_P0  : -7.79167e-03 ± 2.35523e-02
  ADC_P1  : 8.48755e-03 ± 5.96810e-04
  ADC_P2  : -5.32545e-06 ± 3.00180e-06
  CSA_Chi2/NDF : 1.17678e-04 / 2
  CSA_P0  : 5.81239e-02 ± 7.23553e-03
  CSA_P1  : 9.90396e-03 ± 5.45145e-04
  CSA_P2  : -4.38300e-05 ± 8.30191e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [32, 48, 58, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [7, 10, 34, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3672', '1.800', '0.1631', '1.799', '0.0924', '7.000', '0.7090', 1, 1, 1, 1, 1725961600.5762866]
VI_after__Init : ['1.202', '0.3673', '1.800', '0.1631', '1.799', '0.0850', '7.000', '0.7083', 1, 1, 1, 1, 1725961608.6947277]
VI_at__the_End : ['1.202', '0.5044', '1.800', '0.1388', '1.799', '0.1100', '7.000', '0.7085', 1, 1, 1, 1, 1725961674.135548]