TEST_NAME : Wafer
TEST_DATE : 24_09_10-12_28_33
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-007-004-09 | FUSED_ID : 6359364768397029449
  IC_TEMP :  -52.08 | VDDM : 1115.09 | AUX_INT :   -7.83 | CsaBias :   72.05
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.02494e-03 / 2
  ADC_P0  : -7.82571e-03 ± 2.16621e-02
  ADC_P1  : 8.04124e-03 ± 5.10017e-04
  ADC_P2  : -5.40436e-06 ± 2.37985e-06
  CSA_Chi2/NDF : 1.18355e-04 / 2
  CSA_P0  : 5.70633e-02 ± 7.25632e-03
  CSA_P1  : 1.00148e-02 ± 5.46711e-04
  CSA_P2  : -4.63744e-05 ± 8.32576e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [4, 21, 72, 81, 86, 96]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [14, 56, 107, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3366', '1.800', '0.1669', '1.800', '0.0896', '7.000', '0.7075', 1, 1, 1, 1, 1725964113.3039465]
VI_after__Init : ['1.201', '0.3368', '1.800', '0.1669', '1.800', '0.0837', '7.000', '0.7075', 1, 1, 1, 1, 1725964121.3834605]
VI_at__the_End : ['1.202', '0.4988', '1.800', '0.1385', '1.800', '0.1114', '7.000', '0.7084', 1, 1, 1, 1, 1725964189.7225757]