TEST_NAME : Wafer
TEST_DATE : 24_09_10-12_23_43
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-007-007-09 | FUSED_ID : 6359364768397029497
  IC_TEMP :  -55.13 | VDDM : 1125.73 | AUX_INT :   -8.08 | CsaBias :   89.52
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17911e-03 / 2
  ADC_P0  : -8.07604e-03 ± 2.32833e-02
  ADC_P1  : 8.19480e-03 ± 5.65933e-04
  ADC_P2  : -5.12639e-06 ± 2.73263e-06
  CSA_Chi2/NDF : 1.22714e-04 / 2
  CSA_P0  : 5.93765e-02 ± 7.38872e-03
  CSA_P1  : 9.63545e-03 ± 5.56686e-04
  CSA_P2  : -4.32966e-05 ± 8.47768e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [19, 21, 28, 71, 84, 109, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [53, 59, 91, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3749', '1.800', '0.1913', '1.800', '0.1032', '7.000', '0.7081', 1, 1, 1, 1, 1725963822.5029755]
VI_after__Init : ['1.202', '0.3751', '1.800', '0.1914', '1.800', '0.0956', '7.000', '0.7074', 1, 1, 1, 1, 1725963831.319573]
VI_at__the_End : ['1.202', '0.4931', '1.800', '0.1394', '1.800', '0.1132', '7.000', '0.7082', 1, 1, 1, 1, 1725963899.6038568]