TEST_NAME : Wafer
TEST_DATE : 24_09_10-12_20_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-007-009-09 | FUSED_ID : 6359364768397029529
  IC_TEMP :  -51.54 | VDDM : 1125.43 | AUX_INT :   -9.07 | CsaBias :   83.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36045e-03 / 2
  ADC_P0  : -9.07194e-03 ± 2.49733e-02
  ADC_P1  : 8.45496e-03 ± 6.10971e-04
  ADC_P2  : -6.23622e-06 ± 2.96550e-06
  CSA_Chi2/NDF : 8.58925e-05 / 2
  CSA_P0  : 5.87877e-02 ± 6.18159e-03
  CSA_P1  : 9.31488e-03 ± 4.65738e-04
  CSA_P2  : -3.84886e-05 ± 7.09264e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [10, 15, 17, 21, 43, 51, 73, 115, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [14, 40, 85, 118, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2869', '1.800', '0.1287', '1.799', '0.0889', '7.000', '0.7081', 1, 1, 1, 1, 1725963628.4736795]
VI_after__Init : ['1.202', '0.2869', '1.800', '0.1287', '1.800', '0.0817', '7.000', '0.7074', 1, 1, 1, 1, 1725963636.5152779]
VI_at__the_End : ['1.202', '0.4917', '1.800', '0.1395', '1.800', '0.1135', '7.001', '0.7075', 1, 1, 1, 1, 1725963704.5017915]