TEST_NAME : Wafer
TEST_DATE : 24_09_10-12_05_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-007-018-14 | FUSED_ID : 6359364768397029678
  IC_TEMP :  -53.88 | VDDM : 1128.36 | AUX_INT :   -5.12 | CsaBias :   79.41
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.10304e-04 / 2
  ADC_P0  : -5.12221e-03 ± 1.80092e-02
  ADC_P1  : 8.51417e-03 ± 4.53125e-04
  ADC_P2  : -6.08676e-06 ± 2.24613e-06
  CSA_Chi2/NDF : 8.07447e-05 / 2
  CSA_P0  : 6.07617e-02 ± 5.99349e-03
  CSA_P1  : 9.77127e-03 ± 4.51566e-04
  CSA_P2  : -4.32068e-05 ± 6.87681e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [10, 19, 38, 51, 78, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [1, 7, 8, 46, 99, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2917', '1.800', '0.1567', '1.800', '0.0876', '7.000', '0.7074', 1, 1, 1, 1, 1725962754.9232738]
VI_after__Init : ['1.202', '0.2918', '1.800', '0.1567', '1.800', '0.0819', '7.000', '0.7075', 1, 1, 1, 1, 1725962763.895656]
VI_at__the_End : ['1.202', '0.5010', '1.800', '0.1412', '1.799', '0.1114', '7.000', '0.7079', 1, 1, 1, 1, 1725962831.6834488]