TEST_NAME : Wafer
TEST_DATE : 24_09_10-11_57_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-007-023-14 | FUSED_ID : 6359364768397029758
  IC_TEMP :  -50.48 | VDDM : 1127.66 | AUX_INT :   -8.56 | CsaBias :   95.76
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36625e-03 / 2
  ADC_P0  : -8.55891e-03 ± 2.50906e-02
  ADC_P1  : 8.08791e-03 ± 6.02820e-04
  ADC_P2  : -4.88673e-06 ± 2.87968e-06
  CSA_Chi2/NDF : 9.82143e-05 / 2
  CSA_P0  : 5.92648e-02 ± 6.61012e-03
  CSA_P1  : 9.59444e-03 ± 4.98025e-04
  CSA_P2  : -4.03469e-05 ± 7.58433e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [47, 57, 78, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [12, 26, 40, 44, 100, 101, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3516', '1.800', '0.1477', '1.800', '0.0922', '7.000', '0.7082', 1, 1, 1, 1, 1725962270.006871]
VI_after__Init : ['1.202', '0.3518', '1.800', '0.1477', '1.799', '0.0869', '7.000', '0.7079', 1, 1, 1, 1, 1725962278.8312252]
VI_at__the_End : ['1.202', '0.5002', '1.800', '0.1389', '1.800', '0.1114', '7.000', '0.7086', 1, 1, 1, 1, 1725962346.2770658]