TEST_NAME : Wafer
TEST_DATE : 24_09_10-12_33_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-008-003-13 | FUSED_ID : 6359364768397033533
  IC_TEMP :  -59.88 | VDDM : 1124.25 | AUX_INT :   -7.92 | CsaBias :   78.30
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.11904e-03 / 2
  ADC_P0  : -7.92317e-03 ± 2.26475e-02
  ADC_P1  : 8.68567e-03 ± 5.75754e-04
  ADC_P2  : -6.37714e-06 ± 2.89781e-06
  CSA_Chi2/NDF : 1.64046e-04 / 2
  CSA_P0  : 5.93873e-02 ± 8.54288e-03
  CSA_P1  : 1.01120e-02 ± 6.43645e-04
  CSA_P2  : -4.81587e-05 ± 9.80195e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [0, 71, 75, 78, 90, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [6, 15, 51, 55, 81]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3888', '1.800', '0.1587', '1.800', '0.0940', '7.000', '0.7085', 1, 1, 1, 1, 1725964405.402088]
VI_after__Init : ['1.201', '0.3888', '1.800', '0.1588', '1.800', '0.0860', '7.000', '0.7076', 1, 1, 1, 1, 1725964413.39947]
VI_at__the_End : ['1.201', '0.5019', '1.800', '0.1436', '1.800', '0.1137', '7.000', '0.7083', 1, 1, 1, 1, 1725964473.9720755]