TEST_NAME : Wafer
TEST_DATE : 24_09_10-12_35_02
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-008-004-13 | FUSED_ID : 6359364768397033549
  IC_TEMP :  -55.69 | VDDM : 1116.68 | AUX_INT :   -8.49 | CsaBias :   84.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.27320e-03 / 2
  ADC_P0  : -8.49242e-03 ± 2.41937e-02
  ADC_P1  : 8.54374e-03 ± 6.09670e-04
  ADC_P2  : -5.73350e-06 ± 3.05185e-06
  CSA_Chi2/NDF : 1.33483e-04 / 2
  CSA_P0  : 5.93740e-02 ± 7.70610e-03
  CSA_P1  : 9.71400e-03 ± 5.80599e-04
  CSA_P2  : -4.29361e-05 ± 8.84184e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [70, 85, 91, 94, 102, 104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [30, 68, 72, 93, 105, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3005', '1.800', '0.1522', '1.800', '0.0866', '7.000', '0.7079', 1, 1, 1, 1, 1725964501.9970217]
VI_after__Init : ['1.202', '0.3005', '1.800', '0.1521', '1.800', '0.0811', '7.000', '0.7076', 1, 1, 1, 1, 1725964510.7173717]
VI_at__the_End : ['1.201', '0.4976', '1.800', '0.1407', '1.804', '0.1127', '7.000', '0.7085', 1, 1, 1, 1, 1725964578.0065777]