TEST_NAME : Wafer
TEST_DATE : 24_09_10-12_36_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-008-005-13 | FUSED_ID : 6359364768397033565
  IC_TEMP :  -55.48 | VDDM : 1122.87 | AUX_INT :   -8.00 | CsaBias :   81.98
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.06524e-03 / 2
  ADC_P0  : -7.99831e-03 ± 2.20676e-02
  ADC_P1  : 8.24783e-03 ± 5.25609e-04
  ADC_P2  : -6.14127e-06 ± 2.47615e-06
  CSA_Chi2/NDF : 1.19016e-04 / 2
  CSA_P0  : 5.94876e-02 ± 7.27655e-03
  CSA_P1  : 9.64297e-03 ± 5.48235e-04
  CSA_P2  : -4.14631e-05 ± 8.34897e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [103, 120, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [1, 14, 24, 49, 61, 73, 79, 83, 90, 96, 97, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2894', '1.800', '0.1259', '1.800', '0.0865', '7.000', '0.7077', 1, 1, 1, 1, 1725964599.432928]
VI_after__Init : ['1.202', '0.2897', '1.800', '0.1259', '1.799', '0.0807', '7.000', '0.7076', 1, 1, 1, 1, 1725964607.6242936]
VI_at__the_End : ['1.202', '0.4979', '1.800', '0.1391', '1.800', '0.1121', '7.000', '0.7085', 1, 1, 1, 1, 1725964673.1926453]