TEST_NAME : Wafer
TEST_DATE : 24_09_10-12_49_35
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-008-013-13 | FUSED_ID : 6359364768397033693
  IC_TEMP :  -52.98 | VDDM : 1131.13 | AUX_INT :   -7.78 | CsaBias :   74.82
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01945e-03 / 2
  ADC_P0  : -7.77925e-03 ± 2.16248e-02
  ADC_P1  : 8.31409e-03 ± 5.31832e-04
  ADC_P2  : -5.40327e-06 ± 2.59598e-06
  CSA_Chi2/NDF : 8.47409e-05 / 2
  CSA_P0  : 6.04605e-02 ± 6.14001e-03
  CSA_P1  : 9.90646e-03 ± 4.62605e-04
  CSA_P2  : -4.54958e-05 ± 7.04493e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [22, 50, 55, 72, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [31, 63, 91, 97, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3316', '1.800', '0.1500', '1.799', '0.0955', '7.000', '0.7079', 1, 1, 1, 1, 1725965374.7086701]
VI_after__Init : ['1.201', '0.3319', '1.800', '0.1500', '1.800', '0.0901', '7.000', '0.7080', 1, 1, 1, 1, 1725965382.8810396]
VI_at__the_End : ['1.201', '0.4994', '1.800', '0.1409', '1.800', '0.1120', '7.000', '0.7084', 1, 1, 1, 1, 1725965450.6828291]