TEST_NAME : Wafer
TEST_DATE : 24_09_10-12_52_48
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-008-015-13 | FUSED_ID : 6359364768397033725
  IC_TEMP :  -51.46 | VDDM : 1127.92 | AUX_INT :   -7.86 | CsaBias :   75.23
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.07946e-03 / 2
  ADC_P0  : -7.86228e-03 ± 2.22215e-02
  ADC_P1  : 8.37079e-03 ± 5.40076e-04
  ADC_P2  : -6.19186e-06 ± 2.59499e-06
  CSA_Chi2/NDF : 7.87808e-05 / 2
  CSA_P0  : 6.03106e-02 ± 5.92015e-03
  CSA_P1  : 9.57879e-03 ± 4.46040e-04
  CSA_P2  : -4.08025e-05 ± 6.79267e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [9, 10, 44, 67, 80, 90, 112, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [46, 81, 96]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2548', '1.800', '0.2046', '1.799', '0.0942', '7.000', '0.7080', 1, 1, 1, 1, 1725965568.344158]
VI_after__Init : ['1.201', '0.2547', '1.800', '0.2046', '1.800', '0.0886', '7.000', '0.7079', 1, 1, 1, 1, 1725965576.4236357]
VI_at__the_End : ['1.201', '0.4969', '1.800', '0.1420', '1.800', '0.1119', '7.000', '0.7087', 1, 1, 1, 1, 1725965643.746211]