TEST_NAME : Wafer
TEST_DATE : 24_09_10-12_54_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-008-016-10 | FUSED_ID : 6359364768397033738
  IC_TEMP :  -52.73 | VDDM : 1129.47 | AUX_INT :   -7.35 | CsaBias :   86.62
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.92100e-04 / 2
  ADC_P0  : -7.34627e-03 ± 2.13479e-02
  ADC_P1  : 8.60439e-03 ± 5.47631e-04
  ADC_P2  : -5.60281e-06 ± 2.78578e-06
  CSA_Chi2/NDF : 1.01496e-04 / 2
  CSA_P0  : 6.08157e-02 ± 6.71964e-03
  CSA_P1  : 9.72953e-03 ± 5.06277e-04
  CSA_P2  : -4.23637e-05 ± 7.70999e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [11, 25, 47, 81, 102, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [26, 64, 94]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3319', '1.800', '0.1385', '1.800', '0.0954', '7.000', '0.7079', 1, 1, 1, 1, 1725965665.2503178]
VI_after__Init : ['1.201', '0.3322', '1.800', '0.1384', '1.800', '0.0898', '7.000', '0.7079', 1, 1, 1, 1, 1725965673.3686426]
VI_at__the_End : ['1.201', '0.5014', '1.800', '0.1432', '1.799', '0.1124', '7.000', '0.7086', 1, 1, 1, 1, 1725965740.9924974]