TEST_NAME : Wafer
TEST_DATE : 24_09_10-13_00_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-008-020-10 | FUSED_ID : 6359364768397033802
  IC_TEMP :  -51.05 | VDDM : 1135.01 | AUX_INT :   -5.72 | CsaBias :   82.42
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.34052e-04 / 2
  ADC_P0  : -5.72295e-03 ± 2.07258e-02
  ADC_P1  : 8.06643e-03 ± 5.04129e-04
  ADC_P2  : -4.83353e-06 ± 2.41817e-06
  CSA_Chi2/NDF : 1.15127e-04 / 2
  CSA_P0  : 5.98659e-02 ± 7.15668e-03
  CSA_P1  : 9.84437e-03 ± 5.39204e-04
  CSA_P2  : -4.33582e-05 ± 8.21144e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [0, 77, 97, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [14, 58, 63, 78, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2213', '1.800', '0.1382', '1.800', '0.0896', '7.000', '0.7083', 1, 1, 1, 1, 1725966052.046016]
VI_after__Init : ['1.202', '0.2211', '1.800', '0.1380', '1.800', '0.0839', '7.000', '0.7079', 1, 1, 1, 1, 1725966060.8243177]
VI_at__the_End : ['1.202', '0.5060', '1.800', '0.1429', '1.800', '0.1114', '7.000', '0.7087', 1, 1, 1, 1, 1725966127.4517748]