TEST_NAME : Wafer
TEST_DATE : 24_09_10-13_05_42
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-008-023-10 | FUSED_ID : 6359364768397033850
  IC_TEMP :  -47.44 | VDDM : 1116.06 | AUX_INT :   -8.09 | CsaBias :   80.04
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.19756e-03 / 2
  ADC_P0  : -8.08794e-03 ± 2.34495e-02
  ADC_P1  : 8.06996e-03 ± 5.56813e-04
  ADC_P2  : -5.27363e-06 ± 2.62158e-06
  CSA_Chi2/NDF : 9.64036e-05 / 2
  CSA_P0  : 6.03086e-02 ± 6.54891e-03
  CSA_P1  : 9.41899e-03 ± 4.93413e-04
  CSA_P2  : -3.85624e-05 ± 7.51409e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [0, 32, 35, 41, 56, 85]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [5, 18, 62, 66, 73, 81, 107, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2022', '1.800', '0.1651', '1.799', '0.0893', '7.000', '0.7080', 1, 1, 1, 1, 1725966342.2573676]
VI_after__Init : ['1.202', '0.2023', '1.800', '0.1650', '1.801', '0.0838', '7.000', '0.7077', 1, 1, 1, 1, 1725966350.3867493]
VI_at__the_End : ['1.201', '0.4993', '1.800', '0.1405', '1.800', '0.1109', '7.000', '0.7086', 1, 1, 1, 1, 1725966419.2821918]