TEST_NAME : Wafer
TEST_DATE : 24_09_10-13_10_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-008-026-10 | FUSED_ID : 6359364768397033898
  IC_TEMP :  -53.47 | VDDM : 1111.78 | AUX_INT :   -7.20 | CsaBias :   85.01
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.80027e-04 / 2
  ADC_P0  : -7.19625e-03 ± 2.00614e-02
  ADC_P1  : 8.44815e-03 ± 4.97632e-04
  ADC_P2  : -5.99639e-06 ± 2.44200e-06
  CSA_Chi2/NDF : 1.32640e-04 / 2
  CSA_P0  : 5.98411e-02 ± 7.68173e-03
  CSA_P1  : 9.80665e-03 ± 5.78763e-04
  CSA_P2  : -4.35408e-05 ± 8.81388e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [24, 72, 78, 85, 86, 100, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [8, 54, 57, 72, 97, 105, 109, 113, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2886', '1.800', '0.1210', '1.800', '0.0931', '7.000', '0.7076', 1, 1, 1, 1, 1725966632.6722517]
VI_after__Init : ['1.201', '0.2887', '1.800', '0.1210', '1.800', '0.0876', '7.000', '0.7075', 1, 1, 1, 1, 1725966640.9376988]
VI_at__the_End : ['1.201', '0.4969', '1.800', '0.1388', '1.800', '0.1119', '7.000', '0.7086', 1, 1, 1, 1, 1725966708.0264287]