TEST_NAME : Wafer
TEST_DATE : 24_09_10-13_12_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-008-027-10 | FUSED_ID : 6359364768397033914
  IC_TEMP :  -50.39 | VDDM : 1128.32 | AUX_INT :   -9.70 | CsaBias :   84.67
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.76174e-03 / 2
  ADC_P0  : -9.70424e-03 ± 2.85337e-02
  ADC_P1  : 8.63990e-03 ± 7.30673e-04
  ADC_P2  : -5.45841e-06 ± 3.73267e-06
  CSA_Chi2/NDF : 1.49076e-04 / 2
  CSA_P0  : 5.80781e-02 ± 8.14379e-03
  CSA_P1  : 1.02141e-02 ± 6.13576e-04
  CSA_P2  : -4.78121e-05 ± 9.34404e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [5, 6, 14, 57, 66, 87, 93, 100, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [7, 45, 92, 94, 96, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2247', '1.800', '0.1467', '1.800', '0.0891', '7.000', '0.7080', 1, 1, 1, 1, 1725966728.953815]
VI_after__Init : ['1.202', '0.2247', '1.800', '0.1467', '1.800', '0.0839', '7.000', '0.7075', 1, 1, 1, 1, 1725966737.1870456]
VI_at__the_End : ['1.201', '0.5060', '1.800', '0.1399', '1.799', '0.1122', '7.000', '0.7080', 1, 1, 1, 1, 1725966803.2109778]