TEST_NAME : Wafer
TEST_DATE : 24_09_10-13_54_01
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-009-002-00 | FUSED_ID : 6359364768397037600
  IC_TEMP :  -55.60 | VDDM : 1114.26 | AUX_INT :   -7.80 | CsaBias :   78.52
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.14688e-03 / 2
  ADC_P0  : -7.80242e-03 ± 2.29202e-02
  ADC_P1  : 8.69797e-03 ± 5.80754e-04
  ADC_P2  : -6.61802e-06 ± 2.90618e-06
  CSA_Chi2/NDF : 9.61126e-05 / 2
  CSA_P0  : 6.08165e-02 ± 6.53902e-03
  CSA_P1  : 9.41538e-03 ± 4.92668e-04
  CSA_P2  : -3.72736e-05 ± 7.50275e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [33, 57, 74, 91, 105, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [18, 31, 34, 41, 52, 63, 85, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2955', '1.800', '0.1759', '1.800', '0.0886', '7.002', '0.7077', 1, 1, 1, 1, 1725969241.1179497]
VI_after__Init : ['1.201', '0.2956', '1.800', '0.1759', '1.800', '0.0831', '7.000', '0.7078', 1, 1, 1, 1, 1725969249.9233084]
VI_at__the_End : ['1.201', '0.5026', '1.800', '0.1418', '1.800', '0.1121', '7.000', '0.7087', 1, 1, 1, 1, 1725969319.0620024]